DocumentCode :
2204605
Title :
A Novel Electromagnetic Method for Local Defects Inspection of Wire Rope
Author :
Cao, Y.N. ; Zhang, D.L. ; Wang, C. ; Gu, Y. ; Xu, D.G.
Author_Institution :
Shenzhen Graduate Sch., Harbin Inst. of Technol., Shenzhen
fYear :
2006
fDate :
14-17 Nov. 2006
Firstpage :
1
Lastpage :
4
Abstract :
Electromagnetic (EM) testing of wire rope is the only effective technology and yields extensive use in the application and manufacturing industry of wire rope. Most EM testing instruments give one-dimensional axial magnetic flux leakage signal, losing the circumferential distribution of defects. Then the identification and classification of the defects largely depend on an operator´s experience. Two-dimensional magnetic leakage signal of wire rope is acquired via an inspection prototype with Hall sensor array in this paper, and an adaptive spatial notch filter is designed to eliminate the inherent strand-waveform noise of the wire rope signal. Then a two-dimensional image recognition algorithm is introduced to identify and classify local defects, which includes feature extraction with Karhunen-Loeve (K-L) transformation and defects classification with neural networks. The experimental results show back propagation (BP) network is effective and has a discrimination of 90% for several typical local defects
Keywords :
adaptive filters; fault location; feature extraction; image classification; image recognition; inspection; magnetic leakage; neural nets; notch filters; ropes; sensor arrays; spatial filters; test equipment; Hall sensor array; Karhunen-Loeve transformation; adaptive spatial notch filter; back propagation network; defect classification; electromagnetic testing instrument; feature extraction; image recognition algorithm; inspection prototype; magnetic flux leakage signal; manufacturing industry; neural network; wire rope; Inspection; Instruments; Magnetic flux leakage; Magnetic sensors; Magnetic separation; Manufacturing industries; Prototypes; Sensor arrays; Testing; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
TENCON 2006. 2006 IEEE Region 10 Conference
Conference_Location :
Hong Kong
Print_ISBN :
1-4244-0548-3
Electronic_ISBN :
1-4244-0549-1
Type :
conf
DOI :
10.1109/TENCON.2006.343716
Filename :
4142406
Link To Document :
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