• DocumentCode
    2205069
  • Title

    Broad beam ion implanter with the use of radio frequency ion source

  • Author

    Abdelaziz, M.E. ; Zakhary, S.G. ; Ghanem, A.A.

  • Author_Institution
    Nucl. Res. Center, Atomic Energy Authority, Cairo, Egypt
  • Volume
    2
  • fYear
    1996
  • fDate
    21-26 Jul 1996
  • Firstpage
    589
  • Abstract
    The project starts with the design of the broad beam RF ion source and the single gap accelerating column. The preliminary results of the source show that the ion current extracted from the source could reach ≃30 mA with extraction voltage ≃2 kV. The beam uniformity is achieved by the use of a multiaperture graphite cathode designed to make perveance matching to the normal Gaussian distribution of the ion beam. The beam uniformity could reach ≃66% of the beam width of ≃6 cm. A design is made of the single gap accelerating column based on tracing of beam lines inside the accelerating gap and estimation of the minimum value of the electric field required to contain the beam against space charge expansion to achieve minimum beam emittance without aberrations
  • Keywords
    Gaussian distribution; beam handling equipment; ion beams; ion implantation; ion sources; normal distribution; particle beam extraction; space charge; 2 kV; 30 mA; C; beam lines tracing; beam uniformity; broad beam RF ion source; broad beam ion implanter; electric field; extraction voltage; ion current extraction; minimum beam emittance; minimum value; multiaperture graphite cathode; normal Gaussian distribution; perveance matching; radiofrequency ion source; single gap accelerating column; space charge expansion; Acceleration; Cathodes; Electron emission; Fault location; Ion beams; Ion sources; Particle beams; Radio frequency; Structural beams; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Discharges and Electrical Insulation in Vacuum, 1996. Proceedings. ISDEIV., XVIIth International Symposium on
  • Conference_Location
    Berkeley, CA
  • Print_ISBN
    0-7803-2906-6
  • Type

    conf

  • DOI
    10.1109/DEIV.1996.545431
  • Filename
    545431