DocumentCode
2205154
Title
Scattering of dielectric cylinder with multi-conductors
Author
Kolbehdari, M.A. ; Sadiku, M.N.O.
Author_Institution
Dept. of Electr. Eng., Temple Univ., Philadelphia, PA, USA
fYear
1996
fDate
11-14 Apr 1996
Firstpage
692
Lastpage
695
Abstract
A rigorous field analysis of scattering from a dielectric circular cylinder with multi-conductors and excited by a magnetic or electric line current in the free space is given in this paper. The field equivalence theorem is utilized to derive, for each excitation, a system of coupled integral equations for the equivalent magnetic and induced currents on the dielectric interfaces and the perfect conductors, respectively. Galerkin´s method is applied to determine the unknown currents, which are used to determine the scattered field outside and inside the dielectric cylinder. Numerical results for the currents, scattered field patterns, and radar cross section of the problem are given for the TE and TM polarizations. It has been shown that the radar cross section is reduced by increasing the dielectric constant of the dielectric cylinder, and the far field is changed by increasing the arc length of the conductors
Keywords
Galerkin method; electric current; electromagnetic induction; electromagnetic wave polarisation; electromagnetic wave scattering; integral equations; radar cross-sections; Galerkin´s method; TE polarizations; TM polarizations; arc length; coupled integral equations; dielectric circular cylinder; dielectric constant; dielectric cylinder; dielectric interfaces; equivalent induced current; equivalent magnetic currents; far field; field equivalence theorem; multi-conductors; perfect conductors; radar cross section; rigorous field analysis; scattered field patterns; scattering; Conductors; Couplings; Dielectric constant; Integral equations; Magnetic analysis; Moment methods; Polarization; Radar cross section; Radar scattering; Tellurium;
fLanguage
English
Publisher
ieee
Conference_Titel
Southeastcon '96. Bringing Together Education, Science and Technology., Proceedings of the IEEE
Conference_Location
Tampa, FL
Print_ISBN
0-7803-3088-9
Type
conf
DOI
10.1109/SECON.1996.510160
Filename
510160
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