• DocumentCode
    2205198
  • Title

    Flash memory technology development

  • Author

    Jun, Zhu

  • Author_Institution
    Inst. of Microelectron., Tsinghua Univ., Beijing, China
  • Volume
    1
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    189
  • Abstract
    As a new non-volatile semiconductor memory, FLASH was introduced by Masuoka in 1984. FLASH has non-volatility, in system rewritability, high density, low-cost and good reliability advantages. It is widely used on file storage, smart IC card, PLD, mobile phone, digital camera, DVD player and so on. This paper describes its programming, cell structure, FLASH array and reliability
  • Keywords
    MOS memory circuits; semiconductor device reliability; FLASH; FLASH array; FLASH reliability; PLD; file storage; flash memory cell structure; flash memory programming; flash memory technology development; good reliability; high density; low-cost; nonvolatile semiconductor memory; smart IC card; system rewritability; EPROM; Electrons; Ferroelectric films; Flash memory; Microelectronics; Nonvolatile memory; Random access memory; Semiconductor memory; Silicon; Tunneling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated-Circuit Technology, 2001. Proceedings. 6th International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    0-7803-6520-8
  • Type

    conf

  • DOI
    10.1109/ICSICT.2001.981453
  • Filename
    981453