Title :
Reviews and Prospects of Low-Voltage Nano-Scale Embedded RAMs
Author_Institution :
Central Res. Lab., Hitachi Ltd., Tokyo
Abstract :
Low-voltage nanoscale embedded RAMs are described, focusing on RAM cells and peripheral circuits. First, challenges and trends of low-voltage RAM cells are discussed in terms of signal charge, signal voltage, and noise. ECC to cope with the ever-increasing soft-error rate, power-supply controls to widen the voltage margin of cells, and a fully-depleted SOI to reduce VT-variation are also investigated. Then peripheral circuits are explained in terms of leakage reduction and compensation for speed variations. Based on this, it is concluded that low-voltage RAMs cannot be achieved without reducing speed variations caused by variations in VT, thus resulting in a further need for compensation circuits and new devices with reduced VT variation
Keywords :
embedded systems; leakage currents; low-power electronics; nanoelectronics; random-access storage; silicon-on-insulator; ECC; RAM cells; compensation circuit; fully-depleted SOI; leakage reduction; low-voltage nanoscale embedded RAM; peripheral circuit; power-supply control; signal charge; signal voltage; soft-error rate; speed variation compensation; Capacitors; Circuit noise; Leakage current; Parasitic capacitance; Power dissipation; Random access memory; Signal design; Subthreshold current; Voltage control;
Conference_Titel :
Microelectronics, 2006 25th International Conference on
Conference_Location :
Belgrade
Print_ISBN :
1-4244-0117-8
DOI :
10.1109/ICMEL.2006.1650899