DocumentCode
2205287
Title
Low turn-on voltage InP/In0.7Ga0.3As/InP double heterojunction bipolar transistors
Author
Kim, Y.M. ; Lai, K. ; Rodwell, M.J.W. ; Gossard, A.C.
Author_Institution
Dept. of Mater., California Univ., Santa Barbara, CA, USA
fYear
2003
fDate
25-27 Aug. 2003
Firstpage
203
Lastpage
204
Abstract
In this paper, low Vbe HBTs were developed in the InP based material system, taking advantage of both its maturity and the high bandgap and breakdown field of an InP collector.
Keywords
III-V semiconductors; energy gap; gallium arsenide; heterojunction bipolar transistors; indium compounds; leakage currents; semiconductor device breakdown; semiconductor devices; HBT; InP collector; InP-InGaAs-InP; InP/In0.7Ga0.3As/InP double heterojunction bipolar transistors; bandgap; breakdown field; Aerospace materials; Bipolar integrated circuits; DH-HEMTs; Double heterojunction bipolar transistors; Heterojunction bipolar transistors; Indium phosphide; Lattices; Leakage current; Low voltage; Photonic band gap;
fLanguage
English
Publisher
ieee
Conference_Titel
Compound Semiconductors, 2003. International Symposium on
Print_ISBN
0-7803-7820-2
Type
conf
DOI
10.1109/ISCS.2003.1239976
Filename
1239976
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