• DocumentCode
    2205844
  • Title

    High-level synthesis for testability

  • Author

    Marzouki, M. ; Alves, V. Castro ; Antunes, A. Ribeiro

  • Author_Institution
    TIMA/INPG, Grenoble, France
  • Volume
    2
  • fYear
    1995
  • fDate
    13-16 Aug 1995
  • Firstpage
    718
  • Abstract
    Progress in synthesis development has made commercially available tools that allow automatic synthesis of designs, starting from their RTL description. More recently, some tools even starting from the behavioral description have appeared on the market. However, the synthesized designs an rather hard to test. What is commonly achieved is to add testability features at the gate level, after the synthesis process has been done, which results in high area overhead and poor design performances. A lot of research work is currently on-going trying to take into account testability features at higher levels, that is, RTL or even behavioral level. We propose a general framework for an efficient high-level synthesis or testability methodology
  • Keywords
    circuit CAD; design for testability; high level synthesis; integrated circuit design; integrated circuit testing; logic testing; RTL description; automatic synthesis; behavioral description; high-level synthesis; synthesis for testability; testability methodology; Automatic testing; Control system synthesis; Costs; Design for testability; High level synthesis; Libraries; Network synthesis; Performance evaluation; Software testing; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1995., Proceedings., Proceedings of the 38th Midwest Symposium on
  • Conference_Location
    Rio de Janeiro
  • Print_ISBN
    0-7803-2972-4
  • Type

    conf

  • DOI
    10.1109/MWSCAS.1995.510190
  • Filename
    510190