DocumentCode
2205844
Title
High-level synthesis for testability
Author
Marzouki, M. ; Alves, V. Castro ; Antunes, A. Ribeiro
Author_Institution
TIMA/INPG, Grenoble, France
Volume
2
fYear
1995
fDate
13-16 Aug 1995
Firstpage
718
Abstract
Progress in synthesis development has made commercially available tools that allow automatic synthesis of designs, starting from their RTL description. More recently, some tools even starting from the behavioral description have appeared on the market. However, the synthesized designs an rather hard to test. What is commonly achieved is to add testability features at the gate level, after the synthesis process has been done, which results in high area overhead and poor design performances. A lot of research work is currently on-going trying to take into account testability features at higher levels, that is, RTL or even behavioral level. We propose a general framework for an efficient high-level synthesis or testability methodology
Keywords
circuit CAD; design for testability; high level synthesis; integrated circuit design; integrated circuit testing; logic testing; RTL description; automatic synthesis; behavioral description; high-level synthesis; synthesis for testability; testability methodology; Automatic testing; Control system synthesis; Costs; Design for testability; High level synthesis; Libraries; Network synthesis; Performance evaluation; Software testing; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 1995., Proceedings., Proceedings of the 38th Midwest Symposium on
Conference_Location
Rio de Janeiro
Print_ISBN
0-7803-2972-4
Type
conf
DOI
10.1109/MWSCAS.1995.510190
Filename
510190
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