Title :
Simulation of beam collector heating patterns in small-orbit gyrodevices
Author :
Calame, J.F. ; Danly, B.G. ; Levush, B. ; Nguyen, K.T. ; Blank, M. ; Felch, K. ; Chu, T.S.
Author_Institution :
Naval Res. Lab., Washington, DC, USA
Abstract :
Summary form only given. An important issue in the development of high average power gyrodevices is the design of the electron beam collector, which typically can handle local, time-averaged power densities of 0.5-1.0 kW/cm/sup 2/. The spiraling beams employed in gyrodevices can create zones of enhanced local heating in the collector as a result of the turning-point behavior of the electron orbits, a situation which is not found in conventional linear beam amplifiers. Nevertheless, with careful tailoring of the axial magnetic field profile in the collector region, a fairly uniform heating pattern in the collector can be achieved. The procedure for producing simulated collector maps will be illustrated using a 10 kW average power, 94 GHz gyroklystron as an example. The computed effects of angular and transverse collector misalignments and other beam asymmetries will be presented. The simulations will be compared with experimentally observed heating patterns.
Keywords :
gyrotrons; klystrons; millimetre wave power amplifiers; simulation; 10 kW; 94 GHz; axial magnetic field profile; beam collector heating patterns; conventional linear beam amplifiers; electron beam collector; electron orbits; enhanced local heating; gyroklystron; heating pattern; heating patterns; high average power gyrodevices; local time-averaged power densities; simulated collector maps; simulation; small-orbit gyrodevices; spiraling beams; turning-point behavior; Computational modeling; Electron beams; Heating; Laboratories; Magnetic fields; Plasma applications; Plasma simulation; Power industry; Silver; Springs;
Conference_Titel :
Plasma Science, 2000. ICOPS 2000. IEEE Conference Record - Abstracts. The 27th IEEE International Conference on
Conference_Location :
New Orleans, LA, USA
Print_ISBN :
0-7803-5982-8
DOI :
10.1109/PLASMA.2000.854887