Title :
Helium concentration measurements in an atmospheric micro-plasmas using visible emission spectroscopy
Author :
Kim, Dong Yeong ; Kim, Ji H. ; Choi, Yoon Hyuck ; Kim, You Ho ; Hwang, Yoon Sung ; Choe, Wonseok ; Choi, Jin Joo
Author_Institution :
Seoul Nat. Univ., South Korea
Abstract :
Summary form only given, as follows. A simple in-situ gas monitoring system can be developed with micro discharge plasma sources based on optical emission spectroscopy. Helium concentrations are estimated from the visible line emission of atmospheric plasmas generated with various micro plasma discharges. With this technique, volumetric helium concentrations are accurately measured even down to a percent. Since selected emission lines are not affected by moisture, this measuring system can be operated even without sampling and drying processes, which is a crucial element of in-situ monitoring system. The compact in-situ gas monitoring system will be presented, and the system is expected to be applicable to measuring other elements than helium.
Keywords :
atomic emission spectroscopy; helium; plasma chemistry; visible spectra; He; atmospheric plasmas; helium concentration measurements; in-situ gas monitoring system; microdischarge plasma sources; optical emission spectroscopy; visible emission spectroscopy; visible line emission; volumetric concentrations; Atmospheric measurements; Fault location; Helium; Moisture; Monitoring; Plasma measurements; Plasma sources; Spectroscopy; Stimulated emission; Volume measurement;
Conference_Titel :
Plasma Science, 2002. ICOPS 2002. IEEE Conference Record - Abstracts. The 29th IEEE International Conference on
Conference_Location :
Banff, Alberta, Canada
Print_ISBN :
0-7803-7407-X
DOI :
10.1109/PLASMA.2002.1030330