Title :
Classification and remediation of electrical faults in the switched reluctance drive
Author :
Gopalakrishnan, Suresh ; Omekanda, Avoki M. ; Lequesne, Bruno
Author_Institution :
Delphi Res. Labs., Shelby Parkway, MI, USA
Abstract :
The switched reluctance drive is known to be fault tolerant, but it is not fault free. The goals of this study are the systematic classification of all electrical faults, short-and open-circuits, in the switched reluctance drive (excluding the controller itself), and the investigation of fault patterns and possible remediation. Each situation is analyzed via finite element analysis, and/or experiments. The transient effects during the faults are described. Possible remediation schemes other than disabling the faulted phase are explored. There is a particular focus on switch short-circuit for which new results are presented.
Keywords :
fault location; fault tolerance; reluctance motor drives; short-circuit currents; transients; electrical faults; fault free; fault tolerant; finite element analysis; open-circuit faults; short-circuit faults; switched reluctance drive; Circuit faults; Fault tolerance; Finite element methods; Inverters; Magnetic analysis; Mechanical sensors; Signal processing; Strontium; Switches; Switching circuits;
Conference_Titel :
Industry Applications Conference, 2005. Fourtieth IAS Annual Meeting. Conference Record of the 2005
Print_ISBN :
0-7803-9208-6
DOI :
10.1109/IAS.2005.1518846