• DocumentCode
    2206585
  • Title

    Classification and remediation of electrical faults in the switched reluctance drive

  • Author

    Gopalakrishnan, Suresh ; Omekanda, Avoki M. ; Lequesne, Bruno

  • Author_Institution
    Delphi Res. Labs., Shelby Parkway, MI, USA
  • Volume
    4
  • fYear
    2005
  • fDate
    2-6 Oct. 2005
  • Firstpage
    2734
  • Abstract
    The switched reluctance drive is known to be fault tolerant, but it is not fault free. The goals of this study are the systematic classification of all electrical faults, short-and open-circuits, in the switched reluctance drive (excluding the controller itself), and the investigation of fault patterns and possible remediation. Each situation is analyzed via finite element analysis, and/or experiments. The transient effects during the faults are described. Possible remediation schemes other than disabling the faulted phase are explored. There is a particular focus on switch short-circuit for which new results are presented.
  • Keywords
    fault location; fault tolerance; reluctance motor drives; short-circuit currents; transients; electrical faults; fault free; fault tolerant; finite element analysis; open-circuit faults; short-circuit faults; switched reluctance drive; Circuit faults; Fault tolerance; Finite element methods; Inverters; Magnetic analysis; Mechanical sensors; Signal processing; Strontium; Switches; Switching circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industry Applications Conference, 2005. Fourtieth IAS Annual Meeting. Conference Record of the 2005
  • ISSN
    0197-2618
  • Print_ISBN
    0-7803-9208-6
  • Type

    conf

  • DOI
    10.1109/IAS.2005.1518846
  • Filename
    1518846