• DocumentCode
    2206766
  • Title

    Preparation of high purity water with low concentration of dissolved oxygen (DO) and total organic carbon (TOC) for VLSI process

  • Author

    Wen, Ruimei ; Zhu, ZhiLiang ; Chen, Shenli

  • Author_Institution
    Electron. & Inf. Coll., Tongji Univ., Shanghai, China
  • Volume
    1
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    475
  • Abstract
    To meet the needs of the rapid development of VLSI for high purity water, high quality equipment for high purity water with the capacity of 10t/h has been designed and built. The equipment contains triply connected membrane contactors working at 22°C under a pressure of 0.01 Mpa with N2 flow rate of 2.3 m3/h, a double RO and an 185 nm UV lamp. After the treatment by using the equipment the DO concentration can be decreased from 3000 μg/L down to 0.6 μg/L and the TOC concentration from 9000 μg/L down to 0.7 μg/L which satisfies the requirement of VLSI fabrication
  • Keywords
    VLSI; organic compounds; ultraviolet radiation effects; water; water treatment; 22 C; H2O; TOC concentration; UV lamp; VLSI fabrication; VLSI process; capacity; dissolved oxygen; flow rate; high purity water; total organic carbon; treatment; triply connected membrane contactors; Amorphous silicon; Atmosphere; Biomembranes; Contactors; Fabrication; Nitrogen; Oxidation; Oxygen; Random access memory; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated-Circuit Technology, 2001. Proceedings. 6th International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    0-7803-6520-8
  • Type

    conf

  • DOI
    10.1109/ICSICT.2001.981521
  • Filename
    981521