DocumentCode
2206766
Title
Preparation of high purity water with low concentration of dissolved oxygen (DO) and total organic carbon (TOC) for VLSI process
Author
Wen, Ruimei ; Zhu, ZhiLiang ; Chen, Shenli
Author_Institution
Electron. & Inf. Coll., Tongji Univ., Shanghai, China
Volume
1
fYear
2001
fDate
2001
Firstpage
475
Abstract
To meet the needs of the rapid development of VLSI for high purity water, high quality equipment for high purity water with the capacity of 10t/h has been designed and built. The equipment contains triply connected membrane contactors working at 22°C under a pressure of 0.01 Mpa with N2 flow rate of 2.3 m3/h, a double RO and an 185 nm UV lamp. After the treatment by using the equipment the DO concentration can be decreased from 3000 μg/L down to 0.6 μg/L and the TOC concentration from 9000 μg/L down to 0.7 μg/L which satisfies the requirement of VLSI fabrication
Keywords
VLSI; organic compounds; ultraviolet radiation effects; water; water treatment; 22 C; H2O; TOC concentration; UV lamp; VLSI fabrication; VLSI process; capacity; dissolved oxygen; flow rate; high purity water; total organic carbon; treatment; triply connected membrane contactors; Amorphous silicon; Atmosphere; Biomembranes; Contactors; Fabrication; Nitrogen; Oxidation; Oxygen; Random access memory; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State and Integrated-Circuit Technology, 2001. Proceedings. 6th International Conference on
Conference_Location
Shanghai
Print_ISBN
0-7803-6520-8
Type
conf
DOI
10.1109/ICSICT.2001.981521
Filename
981521
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