Title :
SiC Based Pressure Sensor for High-Temperature Environments
Author :
Wieczorek, G. ; Schellin, B. ; Obermeier, E. ; Fagnani, G. ; Drera, L.
Author_Institution :
Tech. Univ. of Berlin, Berlin
Abstract :
Aim of the work presented herein is to develop a SiC based pressure sensor enabling measurements up to 3000 bar at temperatures in the range of 25degC to 400degC. For fabrication of the sensor chip various processing techniques potentially permitting effective membrane structuring are compared. The sensor chip features a centerboss membrane with four piezoresistors made from epitaxial layers. To limit movement of the centerboss, a bottom plate wafer made from SiC is bonded to the sensor chip. The bottom plate is thus acting as an overpressure safety feature. A tungsten-based metallization scheme tested up to 500degC is used. The housing of the sensor is fluid-free and employs a steel membrane for media separation.
Keywords :
high-temperature electronics; membranes; piezoresistive devices; pressure measurement; pressure sensors; resistors; semiconductor device metallisation; silicon compounds; wide band gap semiconductors; SiC; bottom plate wafer; centerboss membrane; epitaxial layers; fluid-free sensor housing; media separation; overpressure safety feature; piezoresistors; pressure 3000 bar; pressure sensor; sensor chip fabrication; steel membrane; temperature 25 degC to 400 degC; temperature 500 degC; tungsten-based metallization scheme; Biomembranes; Epitaxial layers; Fabrication; Piezoresistive devices; Pressure measurement; Semiconductor device measurement; Sensor phenomena and characterization; Silicon carbide; Temperature distribution; Temperature sensors;
Conference_Titel :
Sensors, 2007 IEEE
Conference_Location :
Atlanta, GA
Print_ISBN :
978-1-4244-1261-7
Electronic_ISBN :
1930-0395
DOI :
10.1109/ICSENS.2007.4388508