DocumentCode :
2206909
Title :
Optical diagnostic for examination of fast and thermal electrons from a helicon plasma source
Author :
Scharer, J. ; Akhtar, K. ; Pallet, E. ; White, B. ; Tysk, S.
Author_Institution :
Wisconsin Univ., Madison, WI, USA
fYear :
2002
fDate :
26-30 May 2002
Firstpage :
166
Abstract :
Summary form only given, as follows. Helicon waves are excited in an argon plasma discharge by a twisted double helix antenna operating at 13.56 MHz. Two optical probes are used. One can be inserted into a I cm diameter glass tube in the center of the plasma chamber (about 11 cm diameter). The other observes the plasma from the outside. The optical probes are measuring emission from the short-lifetime At II states. Software is used to correlate the optical emission to the phase of the RF source. The Ar II emission is measured along with B-dot and Langmuir probe measurements at different axial positions. 105 GHz and 10 GHz; interferometry are used to verify Langmuir probe measurements. The result is to compare Ar II emission to B/sub z/ phase velocity and plasma density to determine the traveling wave particle and background Maxwellian interactions. The background level and modulation index of the Ar II emission is measured for this reason.
Keywords :
antennas in plasma; argon; plasma density; plasma probes; plasma sources; Langmuir probe measurements; MM-wave interferometry; RF source; antenna-wave-particle interactions; background Maxwellian interactions; collisional high-pressure regimes; fast electrons; helicon plasma source; helicon waves; optical diagnostic; plasma discharge; plasma production; short-lifetime states; thermal electrons; traveling wave particle interactions; twisted double helix antenna; Argon; Electron optics; Optical interferometry; Plasma diagnostics; Plasma measurements; Plasma sources; Plasma waves; Position measurement; Probes; Stimulated emission;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science, 2002. ICOPS 2002. IEEE Conference Record - Abstracts. The 29th IEEE International Conference on
Conference_Location :
Banff, Alberta, Canada
Print_ISBN :
0-7803-7407-X
Type :
conf
DOI :
10.1109/PLASMA.2002.1030371
Filename :
1030371
Link To Document :
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