Title :
Notched sub-100 nm gate MOSFETs for analog applications
Author :
Wu, Dongping ; Hellberg, Per-Erik ; Zhang, Shi-Li ; Östling, Mikael
Author_Institution :
Dept. of Microelectron. & Inf. Technol., R. Inst. of Technol., Kista, Sweden
Abstract :
MOSFETs with a notched gate are studied by two-dimensional numerical simulation. It is found that the inclusion of a notch substantially reduces the gate-to-drain and gate-to-source capacitance. Only a minor reduction in drain current and transconductance is found when the physical dimension of the notch is controlled not to exceed the overlap distance between the gate and the source/drain extension. Under such conditions, the cut-off frequency of the MOSFETs with a notched gate can increase by 30% compared to conventional MOSFETs. The largest increase in cut-off frequency is found in the weak and moderate inversion regions. The results suggest that the notched-gate architecture is suitable for high frequency analog CMOS applications
Keywords :
CMOS analogue integrated circuits; MOSFET; capacitance; inversion layers; semiconductor device models; MOSFETs; analog applications; cut-off frequency; drain current; gate-to-drain capacitance; gate-to-source capacitance; high frequency analog CMOS; moderate inversion regions; notched gate; overlap distance; physical dimension; transconductance; two-dimensional numerical simulation; weak inversion regions; Cutoff frequency; Electrodes; Information technology; Ion implantation; MOSFETs; Microelectronics; Numerical simulation; Parasitic capacitance; Transconductance; Voltage;
Conference_Titel :
Solid-State and Integrated-Circuit Technology, 2001. Proceedings. 6th International Conference on
Conference_Location :
Shanghai
Print_ISBN :
0-7803-6520-8
DOI :
10.1109/ICSICT.2001.981536