Title :
Predicting fault prone modules by the Dempster-Shafer belief networks
Author :
Guo, Lan ; Cukic, Bojan ; Singh, Harshinder
Author_Institution :
Lane Dept. of CSEE, West Virginia Univ., Morgantown, WV, USA
Abstract :
This paper describes a novel methodology for predicting fault prone modules. The methodology is based on Dempster-Shafer (D-S) belief networks. Our approach consists of three steps: first, building the D-S network by the induction algorithm; second, selecting the predictors (attributes) by the logistic procedure; third, feeding the predictors describing the modules of the current project into the inducted D-S network and identifying fault prone modules. We applied this methodology to a NASA dataset. The prediction accuracy of our methodology is higher than that achieved by logistic regression or discriminant analysis on the same dataset.
Keywords :
belief networks; fault diagnosis; knowledge engineering; software quality; software reliability; D-S belief networks; Dempster-Shafer; NASA dataset; attributes selection; discriminant analysis; fault prone modules prediction; induction algorithm; logistic procedure; logistic regression; prediction accuracy; predictors selection; Accuracy; Classification tree analysis; Fault diagnosis; Lab-on-a-chip; Logistics; NASA; Power system modeling; Predictive models; Software quality; Statistics;
Conference_Titel :
Automated Software Engineering, 2003. Proceedings. 18th IEEE International Conference on
Print_ISBN :
0-7695-2035-9
DOI :
10.1109/ASE.2003.1240314