DocumentCode :
2207830
Title :
Reduction of ionosphere divergence error in GPS code measurement smoothing by use of a non-linear process
Author :
Sen, Shiladitya ; Rife, Jason
Author_Institution :
Tufts Univ., Medford, MA
fYear :
2008
fDate :
5-8 May 2008
Firstpage :
312
Lastpage :
320
Abstract :
This paper develops a single-frequency filter for smoothing GPS code measurements using a nonlinear method. The method zeroes steady-state divergence errors caused by ionospheric storms. The filter has significant potential to improve the availability of safety-critical differential GPS systems such as Ground-Based Augmentation Systems (GBAS). These systems, of which the Local Area Augmented System (LAAS) is one example, typically rely on a Hatch Filter for code smoothing. Although the Hatch filter offers excellent noise reduction and ease of implement under nominal conditions, the filter amplifies ionosphere errors under rare, anomalous storm conditions. Our method generalizes the Hatch Filter by adding a correction term which is computed through a nonlinear process. The nonlinear process detects high ionosphere-delay gradients and estimates the appropriate correction term for the Hatch Filter. Experimental trials indicate that the nonlinear filter not only zeroes steady-state divergence but also reduces maximum transient errors by 0-25% relative to the Hatch Filter without impacting filter noise under nominal conditions.
Keywords :
Global Positioning System; ionospheric disturbances; smoothing methods; GPS code measurement smoothing; Hatch filter; code smoothing; ground-based augmentation systems; ionosphere divergence error; ionospheric storms; local area augmented system; nonlinear process; safety-critical differential GPS systems; single-frequency filter; steady-state divergence error; Electrons; Error correction; Filters; Frequency; Global Positioning System; Ionosphere; Noise reduction; Smoothing methods; Steady-state; Storms;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Position, Location and Navigation Symposium, 2008 IEEE/ION
Conference_Location :
Monterey, CA
Print_ISBN :
978-1-4244-1536-6
Electronic_ISBN :
978-1-4244-1537-3
Type :
conf
DOI :
10.1109/PLANS.2008.4570020
Filename :
4570020
Link To Document :
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