• DocumentCode
    2207919
  • Title

    Exploiting Local Data Uncertainty to Boost Global Outlier Detection

  • Author

    Liu, Bo ; Yin, Jie ; Xiao, Yanshan ; Cao, Longbing ; Yu, Philip S.

  • Author_Institution
    Fac. of Eng. & IT, QCIS Univ. of Technol., Sydney, NSW, Australia
  • fYear
    2010
  • fDate
    13-17 Dec. 2010
  • Firstpage
    304
  • Lastpage
    313
  • Abstract
    This paper presents a novel hybrid approach to outlier detection by incorporating local data uncertainty into the construction of a global classifier. To deal with local data uncertainty, we introduce a confidence value to each data example in the training data, which measures the strength of the corresponding class label. Our proposed method works in two steps. Firstly, we generate a pseudo training dataset by computing a confidence value of each input example on its class label. We present two different mechanisms: kernel k-means clustering algorithm and kernel LOF-based algorithm, to compute the confidence values based on the local data behavior. Secondly, we construct a global classifier for outlier detection by generalizing the SVDD-based learning framework to incorporate both positive and negative examples as well as their associated confidence values. By integrating local and global outlier detection, our proposed method explicitly handles the uncertainty of the input data and enhances the ability of SVDD in reducing the sensitivity to noise. Extensive experiments on real life datasets demonstrate that our proposed method can achieve a better tradeoff between detection rate and false alarm rate as compared to four state-of-the-art outlier detection algorithms.
  • Keywords
    data description; learning (artificial intelligence); pattern clustering; probability; support vector machines; uncertainty handling; SVDD based learning; boost global outlier detection; kernel LOF based algorithm; kernel k- means clustering; local data uncertainty; pseudo training dataset; support vector data description; Data uncertainty; Outlier detection; SVDD;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Data Mining (ICDM), 2010 IEEE 10th International Conference on
  • Conference_Location
    Sydney, NSW
  • ISSN
    1550-4786
  • Print_ISBN
    978-1-4244-9131-5
  • Electronic_ISBN
    1550-4786
  • Type

    conf

  • DOI
    10.1109/ICDM.2010.10
  • Filename
    5693984