• DocumentCode
    2208178
  • Title

    Ferroelectric dielectric technology

  • Author

    Nozawa, Hiroshi ; Takayama, Masao ; Koyama, Shinzo

  • Author_Institution
    Graduate Sch. of Energy Sci., Kyoto Univ., Japan
  • Volume
    1
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    687
  • Abstract
    Ferroelectric thin film, which is a kind of functional dielectric, especially provided with hysteresis characteristics in P-E curve, has drawn wide attention in the LSI field, because of its ideal features, like nonvolatility and fast programming operation at low voltage. From various points of view, for example, academic, industry and so on, basic studies have been drastically advanced for this decade. Recently, ferroelectric memory, called FeRAM, succeeds practically in volume production. At this stage, interestis in the theoretical prediction of life of the products and their application to logic devices. This paper has described a leading study on reliability physics and some applications of ferroelectric dielectric technology. Finally promising perspectives on the ferroelectric dielectric technology are shown
  • Keywords
    dielectric hysteresis; dielectric polarisation; equivalent circuits; ferroelectric capacitors; ferroelectric storage; random-access storage; LSI; bistable states; domain pinning; equivalent circuits; fast programming operation; ferroelectric capacitor; ferroelectric dielectric technology; ferroelectric memory; ferroelectric thin film; high performance; hysteresis characteristics; imprint phenomenon; instability modeling; logic devices; low voltage; nonvolatile memories; perovskite structure; polarization fatigue; reliability; temperature dependence; thermionic field emission; volume production; Dielectric thin films; Ferroelectric films; Ferroelectric materials; Functional programming; Hysteresis; Large scale integration; Low voltage; Nonvolatile memory; Production; Random access memory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated-Circuit Technology, 2001. Proceedings. 6th International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    0-7803-6520-8
  • Type

    conf

  • DOI
    10.1109/ICSICT.2001.981597
  • Filename
    981597