DocumentCode
2208178
Title
Ferroelectric dielectric technology
Author
Nozawa, Hiroshi ; Takayama, Masao ; Koyama, Shinzo
Author_Institution
Graduate Sch. of Energy Sci., Kyoto Univ., Japan
Volume
1
fYear
2001
fDate
2001
Firstpage
687
Abstract
Ferroelectric thin film, which is a kind of functional dielectric, especially provided with hysteresis characteristics in P-E curve, has drawn wide attention in the LSI field, because of its ideal features, like nonvolatility and fast programming operation at low voltage. From various points of view, for example, academic, industry and so on, basic studies have been drastically advanced for this decade. Recently, ferroelectric memory, called FeRAM, succeeds practically in volume production. At this stage, interestis in the theoretical prediction of life of the products and their application to logic devices. This paper has described a leading study on reliability physics and some applications of ferroelectric dielectric technology. Finally promising perspectives on the ferroelectric dielectric technology are shown
Keywords
dielectric hysteresis; dielectric polarisation; equivalent circuits; ferroelectric capacitors; ferroelectric storage; random-access storage; LSI; bistable states; domain pinning; equivalent circuits; fast programming operation; ferroelectric capacitor; ferroelectric dielectric technology; ferroelectric memory; ferroelectric thin film; high performance; hysteresis characteristics; imprint phenomenon; instability modeling; logic devices; low voltage; nonvolatile memories; perovskite structure; polarization fatigue; reliability; temperature dependence; thermionic field emission; volume production; Dielectric thin films; Ferroelectric films; Ferroelectric materials; Functional programming; Hysteresis; Large scale integration; Low voltage; Nonvolatile memory; Production; Random access memory;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State and Integrated-Circuit Technology, 2001. Proceedings. 6th International Conference on
Conference_Location
Shanghai
Print_ISBN
0-7803-6520-8
Type
conf
DOI
10.1109/ICSICT.2001.981597
Filename
981597
Link To Document