DocumentCode :
2208218
Title :
An improved model of the SEERS diagnostic method
Author :
Brinkmann, R.P.
Author_Institution :
Infineon Technol. AG, Germany
fYear :
2000
fDate :
4-7 June 2000
Firstpage :
192
Abstract :
Summary form only given. The availability of a reliable and efficient method for monitoring the plasma electron density is mandatory for the practical realization of any closed-loop plasma control. In the past, however, diagnostic methods were either prohibitively expensive for any commercial use (e.g., microwave interferometry), provided only indirect information (such as bias voltage, reflected power, or optical emission intensity), or potentially disturbed the process plasma itself (Langmuir probes). SEERS, or self-excited electron resonance spectroscopy, is a novel diagnostic method that overcomes these limitations: It enables the real-time measurement of the electron density in RF driven plasma systems without any form of process contamination. Using the improved plasma model, a parameter study is presented which investigates the response of the SEERS signal to changes in the underlying system parameters, in particular the pressure and the composition of the gas, and the magnitude of the driving RF power. A comparison to experimental data is given.
Keywords :
plasma density; plasma diagnostics; Langmuir probes; RF driven plasma systems; SEERS diagnostic method; bias voltage; closed-loop plasma control; diagnostic method; electron density; gas composition; microwave interferometry; optical emission intensity; plasma electron density; real-time measurement; reflected power; self-excited electron resonance spectroscopy; Availability; Electrons; Microwave theory and techniques; Monitoring; Optical interferometry; Plasma applications; Plasma density; Plasma diagnostics; Plasma measurements; Radio frequency;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science, 2000. ICOPS 2000. IEEE Conference Record - Abstracts. The 27th IEEE International Conference on
Conference_Location :
New Orleans, LA, USA
ISSN :
0730-9244
Print_ISBN :
0-7803-5982-8
Type :
conf
DOI :
10.1109/PLASMA.2000.854988
Filename :
854988
Link To Document :
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