Title :
Silicon substrate microelectrodes voltammetry performances in white wine faults identification and quantification
Author :
Francioso, Luca ; Siciliano, Pietro ; Bjorklund, Robert ; Rulcker, Tina Kratz
Author_Institution :
CNR-IMM Inst. for Microelectron. & Microsyst., Lecce
Abstract :
Main target of present activity was the performances evaluation of micrometric, silicon technology fabricated platinum microelectrodes, for wine faults identification and quantification, adopting a commercial UV 210 nm detector for microelectrodes results validation. Main market applications of this miniaturized detector may be a low cost wine quality assessment portable system.
Keywords :
microelectrodes; microsensors; quality control; voltammetry (chemical analysis); wine industry; cost wine quality assessment portable system; micrometric; performances evaluation; silicon substrate microelectrodes voltammetry; white wine faults identification; white wine faults quantification; Area measurement; Detectors; Electrodes; Fabrication; Fault diagnosis; Microelectrodes; Performance evaluation; Pipelines; Platinum; Silicon;
Conference_Titel :
Sensors, 2007 IEEE
Conference_Location :
Atlanta, GA
Print_ISBN :
978-1-4244-1261-7
Electronic_ISBN :
1930-0395
DOI :
10.1109/ICSENS.2007.4388568
