X-ray spectromicroscopy investigations of fast ions and hot electrons in plasmas, heated by nanosecond laser radiation with different wavelengths

Author

Faenov, A.Ya. ; Skobelev, I.Yu. ; Magunov, A.I. ; Pikuz, T.A. ; Rosmej, F.B. ; Hoffmann, D.H.H. ; Suss, W. ; Geissel, M. ; Bock, Ralph ; Letardi, T. ; Flora, F. ; Bollanti, S. ; Di Lazzaro, P. ; Satov, Yu.A. ; Smakovskii, Yu.B. ; Stepanov, A.E. ; Roerich,

Author_Institution

Multicharged Ions Spectra Data Center, VNIIFRI, Mendeleevo, Russia

fYear

2000

fDate

4-7 June 2000

Firstpage

194

Abstract

Summary form only given. By means of space resolved X-ray spectroscopy we have investigated the generation of fast (up to MeV) ions for various laser installations with different flux densities (10/sup 12/-10/sup 14/ W/cm/sup 2/) and laser wavelengths (/spl lambda/=308 nm, 800 nm, 1.06 /spl mu/m, 10.6 /spl mu/m). The implementation of our spectroscopically determined data into the generally accepted scaling relation diagrams with the axes q/spl lambda//sup 2/ and E/sub ion/, where q is the laser flux density, /spl lambda/ the laser wavelength and E/sub ion/ the fast ion energy showed a large scatter by orders of magnitude. The simultaneous use of mass spectrometry showed reasonable agreement for both methods of measurements. Non-Maxwellian X-ray spectroscopy enabled us for the first time to investigate the generation of fast ions and hot electrons by means of space resolved spectroscopy in plasma areas, where the interaction with the laser beam takes place.

Keywords

X-ray microscopy; X-ray spectra; plasma diagnostics; plasma heating by laser; 1.06 mum; 10.6 mum; 308 nm; 800 nm; X-ray spectromicroscopy; fast ions; flux densities; hot electrons; laser beam interaction; laser flux density; laser radiation wavelengths; mass spectrometry; nanosecond laser radiation; nonMaxwellian X-ray spectroscopy; plasma heating; scaling relation diagrams; space resolved spectroscopy; Electron beams; Energy resolution; Laser beams; Mass spectroscopy; Particle beams; Plasma measurements; Plasma x-ray sources; Wavelength measurement; X-ray lasers; X-ray scattering;

fLanguage

English

Publisher

ieee

Conference_Titel

Plasma Science, 2000. ICOPS 2000. IEEE Conference Record - Abstracts. The 27th IEEE International Conference on

Conference_Location

New Orleans, LA, USA

ISSN

0730-9244

Print_ISBN

0-7803-5982-8

Type

conf

DOI

10.1109/PLASMA.2000.854992

Filename

854992