Title :
Concurrent error detection in analog and mixed-signal integrated circuits
Author :
Lubaszewski, Marcelo ; Mir, Salvador ; Rueda, Adoración ; Huertas, José L.
Author_Institution :
TIMA, Grenoble, France
Abstract :
For many years, on-line testing techniques have been developed for digital circuits using error-detecting codes. More recently, some approaches on concurrent error detection for analog and mixed-signal circuits have been proposed. The techniques based on partial hardware replication and on balance checking are broadly addressed in this paper. Other approaches are briefly discussed
Keywords :
analogue integrated circuits; error detection; fault diagnosis; integrated circuit testing; mixed analogue-digital integrated circuits; analog integrated circuits; balance checking; concurrent error detection; mixed-signal integrated circuits; partial hardware replication; Analog circuits; Circuit faults; Circuit testing; Digital circuits; Fabrication; Hardware; Mixed analog digital integrated circuits; Performance evaluation; Signal processing; System testing;
Conference_Titel :
Circuits and Systems, 1995., Proceedings., Proceedings of the 38th Midwest Symposium on
Conference_Location :
Rio de Janeiro
Print_ISBN :
0-7803-2972-4
DOI :
10.1109/MWSCAS.1995.510299