Title :
On the effectiveness of EMIRR to qualify OpAmps
Author :
Aimonetto, Marco Brignone ; Fiori, Franco
Author_Institution :
Electronics and Telecom. Dpt., Politecnico di Torino, Italy
Abstract :
This paper discusses the pros and cons of the EMIRR, a parameter used to indicate the susceptibility of Operational Amplifiers to ElectroMagnetic Interference. Such a parameter is defined assuming a quadratic relationship between the interference amplitude and the EMI-induced offset. This work shows through analyses and experimental tests that such an assumption is valid only in particular cases, meaning that the application of the EMIRR is limited.
Keywords :
Interference; Logic gates; Power measurement; Radio frequency; Standards; Transistors; Voltage measurement;
Conference_Titel :
Electromagnetic Compatibility (EMC), 2015 IEEE International Symposium on
Conference_Location :
Dresden, Germany
Print_ISBN :
978-1-4799-6615-8
DOI :
10.1109/ISEMC.2015.7256129
