• DocumentCode
    2208686
  • Title

    Sample sizes for system availability

  • Author

    Singh, Vijendra P. ; Swaminathan, Sridhar

  • Author_Institution
    Sun Microsystems Inc., Menlo Park, CA, USA
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    51
  • Lastpage
    55
  • Abstract
    This paper presents a methodology for determining sample sizes for system availability under the assumption that the time between failures and the times to repair are independently and exponentially distributed. For specified "x-nines" availability and confidence levels, a table for sample sizes is generated for different failed and repair events. In order to demonstrate five nines or higher availability at a given confidence, the sensitivity in sample sizes in the tails of the distribution is explored. The proposed method is also utilized to compute the confidence interval estimates for higher nines of availability. For easy use, spread sheets are created in EXCEL and Staroffice to determine the sample size for any combination of higher availability and confidence level
  • Keywords
    failure analysis; maintenance engineering; reliability; spreadsheet programs; EXCEL; Staroffice; confidence interval estimates; confidence levels; failed events; repair events; sensitivity; spread sheets; system availability sample sizes; time between failures; times to repair; x-nines availability; Availability; Bayesian methods; Communication industry; Probability distribution; Queueing analysis; Steady-state; Sun; System testing; Taylor series; Weibull distribution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium, 2002. Proceedings. Annual
  • Conference_Location
    Seattle, WA
  • ISSN
    0149-144X
  • Print_ISBN
    0-7803-7348-0
  • Type

    conf

  • DOI
    10.1109/RAMS.2002.981619
  • Filename
    981619