DocumentCode :
2208686
Title :
Sample sizes for system availability
Author :
Singh, Vijendra P. ; Swaminathan, Sridhar
Author_Institution :
Sun Microsystems Inc., Menlo Park, CA, USA
fYear :
2002
fDate :
2002
Firstpage :
51
Lastpage :
55
Abstract :
This paper presents a methodology for determining sample sizes for system availability under the assumption that the time between failures and the times to repair are independently and exponentially distributed. For specified "x-nines" availability and confidence levels, a table for sample sizes is generated for different failed and repair events. In order to demonstrate five nines or higher availability at a given confidence, the sensitivity in sample sizes in the tails of the distribution is explored. The proposed method is also utilized to compute the confidence interval estimates for higher nines of availability. For easy use, spread sheets are created in EXCEL and Staroffice to determine the sample size for any combination of higher availability and confidence level
Keywords :
failure analysis; maintenance engineering; reliability; spreadsheet programs; EXCEL; Staroffice; confidence interval estimates; confidence levels; failed events; repair events; sensitivity; spread sheets; system availability sample sizes; time between failures; times to repair; x-nines availability; Availability; Bayesian methods; Communication industry; Probability distribution; Queueing analysis; Steady-state; Sun; System testing; Taylor series; Weibull distribution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium, 2002. Proceedings. Annual
Conference_Location :
Seattle, WA
ISSN :
0149-144X
Print_ISBN :
0-7803-7348-0
Type :
conf
DOI :
10.1109/RAMS.2002.981619
Filename :
981619
Link To Document :
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