• DocumentCode
    2208774
  • Title

    Input data characterization factors for complex systems affecting availability estimation accuracy

  • Author

    Durkee, Darren P. ; Pohl, E.A. ; Mykytka, Edward F.

  • Author_Institution
    Air Force Inst. of Technol., Dayton, OH, USA
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    80
  • Lastpage
    89
  • Abstract
    Reliability analysts are often faced with the challenge of characterizing the behavior of system components based on limited data. Insights into which data is most significant and how much data is necessary to achieve desired accuracy requirements would improve the efficiency and cost effectiveness of the data collection and data characterization processes. This research assesses potential significant factors in the probabilistic characterization of component failure and repair behavior with respect to their effect on system availability estimates. Potential factors were screened for significance utilizing a Plackett-Burman experimental design for several system models. Two input data characterization factors were found to have a significant affect on availability estimation accuracy: the size of the system and the number of data points used for component failure and repair distributional fitting. The estimating error was minimized when the structures analyzed were small and many data points (in this case, 25) were used for the distributional fittings. Surprisingly, the assumption of constant component failure rates and the use of empirical repair distributions were found to be equally effective component characterization methods. The results of this study also indicate that there is no apparent benefit in concentrating on ´important´ components for the highest fidelity distributional fittings
  • Keywords
    failure analysis; probability; reliability; statistical analysis; Plackett-Burman experimental design; availability estimation accuracy; complex systems; component failure; component repair; data characterization; data collection; input data characterization factors; probabilistic characterization; reliability analysis; Analytical models; Availability; Costs; Failure analysis; Force measurement; Maintenance; Reliability theory; State estimation; System testing; Weapons;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium, 2002. Proceedings. Annual
  • Conference_Location
    Seattle, WA
  • ISSN
    0149-144X
  • Print_ISBN
    0-7803-7348-0
  • Type

    conf

  • DOI
    10.1109/RAMS.2002.981624
  • Filename
    981624