• DocumentCode
    2209234
  • Title

    Characterization and Noise Analysis of Capacitive MEMS Acoustic Emission Transducers

  • Author

    Wu, Wei ; Greve, David W. ; Oppenheim, Irving J.

  • Author_Institution
    Carnegie Mellon Univ., Pittsburgh
  • fYear
    2007
  • fDate
    28-31 Oct. 2007
  • Firstpage
    1152
  • Lastpage
    1155
  • Abstract
    Resonant type capacitive MEMS transducers were fabricated using a multi-user MEMS process (MUMPs) for the detection of acoustic emission (AE). Electrical and mechanical characterization of the MEMS transducers has been performed. The performance of the transducers is limited by the noise. In this paper, we present the noise analysis, the discussion of noise sources, and show that Brownian noise plays a significant role in the capacitive MEMS transducers.
  • Keywords
    acoustic emission testing; acoustic transducers; capacitive sensors; microsensors; noise; Brownian noise; acoustic emission detection; capacitive MEMS acoustic emission transducers; electrical characterization; mechanical characterization; multi-user MEMS process; noise analysis; noise sources; resonant type capacitive MEMS transducers; Acoustic emission; Acoustic noise; Acoustic signal detection; Acoustic transducers; Damping; Electrodes; Micromechanical devices; Resonant frequency; Ultrasonic transducers; Working environment noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Sensors, 2007 IEEE
  • Conference_Location
    Atlanta, GA
  • ISSN
    1930-0395
  • Print_ISBN
    978-1-4244-1261-7
  • Electronic_ISBN
    1930-0395
  • Type

    conf

  • DOI
    10.1109/ICSENS.2007.4388611
  • Filename
    4388611