• DocumentCode
    2209398
  • Title

    Test Framework Generation for Model-Based Testing in Embedded Systems

  • Author

    Iyenghar, Padma

  • Author_Institution
    Software Eng. Res. Group, Univ. of Osnabrueck, Osnabruck, Germany
  • fYear
    2011
  • fDate
    Aug. 30 2011-Sept. 2 2011
  • Firstpage
    267
  • Lastpage
    274
  • Abstract
    Model Driven Development (MDD) and Model-Based Testing (MBT) are slowly replacing the traditional methods of developing and testing real-time embedded software systems (RTESS). However, even though MBT finds wide applicability in various fields, none of the existing approaches deals with generating test artifacts for deploying MBT in the RTESS. This paper discusses an algorithm for test framework generation and deploying online MBT in RTESS. A novel test framework generation algorithm is introduced which, given the design model (representing the requirements of an RTESS) and a System Under Test (SUT), generates a test framework which comprises of the necessary artifacts to perform MBT in RTESS. The discussed approach eliminates the need for dynamic source code instrumentation for executing the test stimuli in the embedded target. A prototype implementation of the test framework generation algorithm is discussed along with an illustrative example. An empirical comparison between the existing and the proposed approach is provided.
  • Keywords
    embedded systems; program testing; MBT; MDD; RTESS; SUT; model based testing; model driven development; real-time embedded software systems; source code instrumentation; system under test; test framework generation; Algorithm design and analysis; Embedded systems; Light emitting diodes; Monitoring; System analysis and design; Testing; Unified modeling language; Model-Based Testing (MBT); UML Testing Profile (UTP); Unified Modeling Language (UML); embedded systems; test framework;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Engineering and Advanced Applications (SEAA), 2011 37th EUROMICRO Conference on
  • Conference_Location
    Oulu
  • Print_ISBN
    978-1-4577-1027-8
  • Type

    conf

  • DOI
    10.1109/SEAA.2011.48
  • Filename
    6068354