DocumentCode
2209475
Title
The failure of MTTF in availability evaluation
Author
Sun, Hairong ; Han, Jame J.
Author_Institution
Motorola, Chicago, IL, USA
fYear
2002
fDate
2002
Firstpage
279
Lastpage
284
Abstract
In this paper, a truncated bathtub is proposed to model the failure rate of a product with perfect burn-in. We expose some counter-intuition observations, e.g., increasing the MTTF does not necessarily increase the average and instantaneous availability during the product´s lifetime, and the average and instantaneous availability could be improved without changing the MTTF. The MTTF and the steady-state availability are not particularly informative and fail to evaluate the product with time-varying failure rate and short upgrading interval
Keywords
failure analysis; reliability; MTTF; availability evaluation; average availability; instantaneous availability; product failure rate modeling; short upgrading interval; steady-state availability; time-varying failure rate; truncated bathtub; Availability; Electronic components; Electronics industry; Exponential distribution; Industrial electronics; Shape; Steady-state; Stress; Sun; Weibull distribution;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium, 2002. Proceedings. Annual
Conference_Location
Seattle, WA
ISSN
0149-144X
Print_ISBN
0-7803-7348-0
Type
conf
DOI
10.1109/RAMS.2002.981655
Filename
981655
Link To Document