Title :
Reproducibility of JEDEC Standard Current and Voltage Ramp Test Procedures for Thin-Dielectric Breakdown Characterization
Author_Institution :
National Institute of Standards and Technology
Keywords :
Breakdown voltage; Capacitors; Current measurement; Design for quality; Dielectric breakdown; Dielectric measurements; Electric breakdown; Laboratories; Reproducibility of results; Testing;
Conference_Titel :
Integrated Reliability Workshop Final Report, 1993 International
DOI :
10.1109/IRWS.1993.666288
