• DocumentCode
    2209634
  • Title

    Future of plasma treatment of wastes

  • Author

    Plodinec, M.J.

  • Author_Institution
    Mississippi State Univ., MS, USA
  • fYear
    2000
  • fDate
    4-7 June 2000
  • Firstpage
    224
  • Abstract
    Summary form only given. In the last three or four decades, then has been a growing awareness of the potentially devastating effects of toxic wastes (both chemically hazardous and radioactive) on the environment. This is particularly true in the highly industrialized countries. These toxic wastes may be derived from industrial process streams, sewage and trash (generally chemically hazardous waste), or from nuclear power production or production of nuclear materials for defence purposes (radioactive waste). Two types of plasma systems have been extensively examined for waste treatment: plasma arc and plasma torch systems. Use of a plasma torch to achieve temperatures hot enough to treat waste materials is a relatively new concept. Although extensively studied in the US by the Department of Energy, plasma torch systems have not seen significant use for radioactive wastes. However, plasma torch systems are being used for treatment of waste streams in other countries, particularly in Japan.
  • Keywords
    arcs (electric); plasma applications; plasma materials processing; plasma torches; radioactive waste disposal; waste disposal; chemically hazardous waste; defence purposes; environment; highly industrialized countries; industrial process streams; nuclear materials; nuclear power production; plasma arc system; plasma torch systems; plasma treatment; radioactive waste; sewage; toxic wastes; trash; waste treatment; wastes; Chemical hazards; Chemical industry; Chemical processes; Plasma applications; Plasma chemistry; Plasma materials processing; Plasma temperature; Production; Toxic chemicals; Waste materials;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 2000. ICOPS 2000. IEEE Conference Record - Abstracts. The 27th IEEE International Conference on
  • Conference_Location
    New Orleans, LA, USA
  • ISSN
    0730-9244
  • Print_ISBN
    0-7803-5982-8
  • Type

    conf

  • DOI
    10.1109/PLASMA.2000.855049
  • Filename
    855049