DocumentCode :
2209660
Title :
Reliability quantification of induction motors-accelerated degradation testing approach
Author :
Wang, Wendai ; Dragomir-Daescu, Dan
Author_Institution :
Gen. Electr. Corp. R&D Center, Schenectady, NY, USA
fYear :
2002
fDate :
2002
Firstpage :
325
Lastpage :
331
Abstract :
Characterizing life of cheap, highly reliable devices, such as small induction motors, is a challenge due to cost and time restriction. Accelerated degradation testing (ADT) provides a way to predict its life cost- and time-effectively. Having time tracking on degradation signals within relatively short test duration, the reliability can be estimated through accelerated degradation testing, even without any failures. ADT on induction motors have been conducted in the GE R&D Center to quantify the motor reliability. A new degradation index, the Orbit Area, for the induction motors is proposed, which turns out to be one of the most reliable indices for time tracking motor bearing wear. Signal processing method for extracting this degradation index from measured signals was developed. A time-to-degradation model is constructed based on the physics of failure and test observations. Maximum likelihood estimation is employed to analyze test data. The reliability of the motors is finally predicted through the obtained degradation model. Several issues regarding ADT and lessons learned are also discussed in the paper
Keywords :
induction motors; life testing; machine bearings; machine testing; maximum likelihood estimation; reliability; signal processing; accelerated degradation testing; induction motors; life prediction; maximum likelihood estimation; motor bearing wear; physics of failure; reliability estimation; reliability prediction; reliability quantification; signal processing method; test observations; time-to-degradation model; Costs; Data mining; Degradation; Extraterrestrial measurements; Induction motors; Life estimation; Life testing; Maximum likelihood estimation; Physics; Signal processing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium, 2002. Proceedings. Annual
Conference_Location :
Seattle, WA
ISSN :
0149-144X
Print_ISBN :
0-7803-7348-0
Type :
conf
DOI :
10.1109/RAMS.2002.981662
Filename :
981662
Link To Document :
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