DocumentCode
2209713
Title
Tested once, forever right? Influence of aging and temperature on susceptibility and emissions
Author
Borgeest, Kai
Author_Institution
Laboratory of Automotive Engineering, Aschaffenburg University of Applied Sciences, Germany
fYear
2015
fDate
16-22 Aug. 2015
Firstpage
271
Lastpage
276
Abstract
EMC tests are usually done with electronic systems from production under comfortable environmental conditions. The scope of the paper is to analyze how aging and variable environment conditions, in particular temperature, change the electromagnetic behavior. For this purpose typical circuits are selected and sensitive parameters are identified.
Keywords
Aging; Capacitors; Electromagnetic compatibility; Logic gates; Temperature dependence; Temperature sensors; Transistors; CMOS; IGBT; MOSFET; aging; emissions; filter; susceptibility; temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility (EMC), 2015 IEEE International Symposium on
Conference_Location
Dresden, Germany
Print_ISBN
978-1-4799-6615-8
Type
conf
DOI
10.1109/ISEMC.2015.7256171
Filename
7256171
Link To Document