Title :
Tested once, forever right? Influence of aging and temperature on susceptibility and emissions
Author_Institution :
Laboratory of Automotive Engineering, Aschaffenburg University of Applied Sciences, Germany
Abstract :
EMC tests are usually done with electronic systems from production under comfortable environmental conditions. The scope of the paper is to analyze how aging and variable environment conditions, in particular temperature, change the electromagnetic behavior. For this purpose typical circuits are selected and sensitive parameters are identified.
Keywords :
Aging; Capacitors; Electromagnetic compatibility; Logic gates; Temperature dependence; Temperature sensors; Transistors; CMOS; IGBT; MOSFET; aging; emissions; filter; susceptibility; temperature;
Conference_Titel :
Electromagnetic Compatibility (EMC), 2015 IEEE International Symposium on
Conference_Location :
Dresden, Germany
Print_ISBN :
978-1-4799-6615-8
DOI :
10.1109/ISEMC.2015.7256171
