DocumentCode
2209724
Title
Ionic Stress Technique with Individual Vt Measurements on a 144 K SRAM
Author
Watson, Kimball M.
Author_Institution
IBM Microelectronics
fYear
1993
fDate
24-27 Oct 1993
Firstpage
35
Lastpage
39
Keywords
Circuit testing; Contamination; Current measurement; Inverters; Microelectronics; Pollution measurement; Random access memory; Semiconductor device measurement; Stress measurement; Threshold voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Integrated Reliability Workshop Final Report, 1993 International
Type
conf
DOI
10.1109/IRWS.1993.666289
Filename
666289
Link To Document