DocumentCode :
2209742
Title :
Modeling and analysis of time-dependent stress accelerated life data
Author :
Mettas, Adamantios ; Vassiliou, Pantelis
Author_Institution :
ReliaSoft Corp., Tucson, AZ, USA
fYear :
2002
fDate :
2002
Firstpage :
343
Lastpage :
348
Abstract :
The cumulative damage model is examined in this paper in two ways. First for analyzing data obtained from accelerated tests where the applied stress is time-dependent (for example step-stress) and second for making reliability predictions when the service stress is time-dependent (even when the test stress is not time-dependent). For example, the reliability of an aircraft engine, which operates under different stresses during take-off, cruising and landing, can be determined. The cumulative damage model is formulated by assuming the Weibull as the underlying life distribution, and the Arrhenius and inverse power law relationships are considered. The parameters of the model are estimated using maximum likelihood. An algorithm has been developed for the solution of this model, and implemented in a recently released software package, ALTA 6 PRO, specific to accelerated life data analysis. The solution to this model provides the engineers with an opportunity to expand their selection of test conditions when testing products, and to better model actual usage conditions
Keywords :
Weibull distribution; aerospace control; aerospace engines; aerospace simulation; aircraft; life testing; maximum likelihood estimation; reliability; software packages; ALTA 6 PRO software package; Arrhenius relationships; Weibull distribution; aircraft engine reliability; cumulative damage model; inverse power law relationships; life distribution; maximum likelihood estimation; products testing; reliability predictions; step-stress; time-dependent stress accelerated life data analysis; Acceleration; Aircraft propulsion; Data analysis; Life estimation; Maximum likelihood estimation; Power engineering and energy; Software algorithms; Software packages; Stress; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium, 2002. Proceedings. Annual
Conference_Location :
Seattle, WA
ISSN :
0149-144X
Print_ISBN :
0-7803-7348-0
Type :
conf
DOI :
10.1109/RAMS.2002.981665
Filename :
981665
Link To Document :
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