DocumentCode
2209775
Title
Temperature effects on partial discharges in the combined system of a solid-liquid dielectric during lightning impulse voltage
Author
Bourkas, P.D. ; Karagiannopoulos, C.G. ; Agoris, D.P. ; Psomopoulos, C.S.
Author_Institution
Dept. of Electr. & Comput. Eng., Nat. Tech. Univ. of Athens, Greece
Volume
2
fYear
1998
fDate
7-10 Jun 1998
Firstpage
631
Abstract
The experimental work presented in this paper shows that the level of partial discharges in a solid-liquid dielectric increases with temperature. Partial discharge implications in the “metal-dielectric-metal” system were investigated using 1.2/50 μs impulse voltages under environmental temperatures of 20°C and 40°C. Although the repeat rate of the partial discharges appears to be almost independent of temperature, the charge associated with these partial discharges shows a remarkable increase. Furthermore, the threshold electric field required for partial discharge initiation was found to be reduced significantly as the system´s temperature was increased. The commonly accepted model of Gemant and Philipoff incorporating pre-existing defects or irregularities of the molecular structure in the solid-liquid dielectric and voids in the volume of the solid dielectric has been used for the interpretation of the obtained results. The approach of the solid-liquid dielectric to the above experimental results may imply a conductivity increase of the system in the high field region due to enhanced electron avalanche mechanism
Keywords
dielectric liquids; lightning; partial discharges; 20 C; 40 C; Gemant-Philipoff model; defects; electron avalanche; high field conductivity; lightning impulse voltage; metal-dielectric-metal system; molecular structure; partial discharge; solid-liquid dielectric; temperature effect; threshold electric field; voids; Capacitance; Conductivity; Dielectric losses; Electric breakdown; Equivalent circuits; Gases; Partial discharges; Solid modeling; Temperature; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation, 1998. Conference Record of the 1998 IEEE International Symposium on
Conference_Location
Arlington, VA
ISSN
1089-084X
Print_ISBN
0-7803-4927-X
Type
conf
DOI
10.1109/ELINSL.1998.694872
Filename
694872
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