Title :
Single Gate EPROM Cell for the End-of-line Ionic Contamination Test
Author :
Mitros, Jozef C.
Author_Institution :
SEMATECH/National Semiconductor Co.
Keywords :
Capacitance-voltage characteristics; Contamination; Degradation; EPROM; Intrusion detection; MOSFETs; Passivation; Pollution measurement; Testing; Voltage;
Conference_Titel :
Integrated Reliability Workshop Final Report, 1993 International
DOI :
10.1109/IRWS.1993.666290
