• DocumentCode
    2210105
  • Title

    Failure analysis of a high voltage system by probing on the low voltage side

  • Author

    Arens, I. ; Forattini, F.

  • Author_Institution
    European Space Research and Technology Centre, Noordwijk, The Netherlands
  • fYear
    1985
  • fDate
    24-28 June 1985
  • Firstpage
    403
  • Lastpage
    411
  • Abstract
    By probing the primary centre tap voltage of a transformer in a high voltage generator employing closed loop control a distinction can be made between the transients of breakdown events occurring either at the rectified HV output or at the transformer secondary side. The criterium is the speed of decay of the centre tap voltage. The method has been developed for a potted HV system generating 36 KV for the Faint Object Camera (FOC) for the Space Telescope. Computer simulation of the break-down and experimental simulations using the engineering model system have been performed and are reported. Comparisons with observed transients of a system breaking down are made.
  • Keywords
    Capacitors; Computational modeling; Load modeling; RNA; Resistors; Transient analysis; Windings;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics Specialists Conference, 1985 IEEE
  • Conference_Location
    Toulouse, France
  • ISSN
    0275-9306
  • Type

    conf

  • DOI
    10.1109/PESC.1985.7070974
  • Filename
    7070974