DocumentCode
2210212
Title
Multi-dimensional effects in space-charge-limited emission: an improved voltage-current relation for parallel plate geometry
Author
Watrous, J.J. ; Luginsland, John W. ; Frese, Michael H.
Author_Institution
Directed Energy Directorate, Air Force Res. Lab., Kirtland Air Force Base, NM, USA
fYear
2000
fDate
4-7 June 2000
Firstpage
237
Abstract
Summary form only given. Previous analysis (Luginsland, Yau, Gilgenbach, Phy. Rev. Lett., vol. 77, no. 2, p. 4668) of space-charge-limited emission in simple two-dimensional parallel plate geometry indicated that the current-voltage relationship in this geometry was not well approximated in all cases by the simple one-dimensional Child-Langmuir Law. This previous analysis used particle-in-cell code calculations to determine the limiting current for a given voltage and given beam width. This analysis assumed that the beam current density was uniform. A new analysis, based upon numerical solution of the Poisson equation, makes no assumption about the current density, but leaves the current density distribution as an unknown function to be determined. The numerical approach that has been developed to simultaneously determine the electrostatic potential and the beam current density will be described. The numerical method is used to generate a current-voltage relationship for the two-dimensional parallel plate geometry. These results are compared against particle-in-cell code calculations based upon two different approaches to modeling space-charge-limited emission.
Keywords
Poisson equation; current density; space-charge-limited conduction; Poisson equation; beam current density; current density distribution; current-voltage relationship; electrostatic potential; limiting current; multi-dimensional effects; one-dimensional Child-Langmuir Law; parallel plate geometry; particle-in-cell code calculations; space-charge-limited emission; two-dimensional parallel plate geometry; voltage-current relation; Computational geometry; Concurrent computing; Current density; Electrostatics; Laboratories; Military computing; Particle beams; Plasmas; Poisson equations; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Plasma Science, 2000. ICOPS 2000. IEEE Conference Record - Abstracts. The 27th IEEE International Conference on
Conference_Location
New Orleans, LA, USA
ISSN
0730-9244
Print_ISBN
0-7803-5982-8
Type
conf
DOI
10.1109/PLASMA.2000.855073
Filename
855073
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