Title :
Fast transient behavior of thyristor switches
Author :
Hudgins, J.L. ; Portnoy, W.M.
Author_Institution :
Department of Electrical Engineering/Computer Science, Texas Tech University, Lubbock, 79409, USA
Abstract :
The fast pulse switching behavior of center-fired and interdigitated thyristors was studied by switching 10 µs, 1000 A (at 800 V) pulses. Single-shot switching was performed up to 5000 A/µs, and repetitive switching, at 500 Hz and 2000 A/µs for ten hours. No damage to the devices resulted from the switching stresses.
Keywords :
Anodes; Current measurement; Logic gates; Stress; Switches; Thyristors; Voltage measurement;
Conference_Titel :
Power Electronics Specialists Conference, 1985 IEEE
Conference_Location :
Toulouse, France
DOI :
10.1109/PESC.1985.7070981
