• DocumentCode
    2210263
  • Title

    Fast transient behavior of thyristor switches

  • Author

    Hudgins, J.L. ; Portnoy, W.M.

  • Author_Institution
    Department of Electrical Engineering/Computer Science, Texas Tech University, Lubbock, 79409, USA
  • fYear
    1985
  • fDate
    24-28 June 1985
  • Firstpage
    458
  • Lastpage
    462
  • Abstract
    The fast pulse switching behavior of center-fired and interdigitated thyristors was studied by switching 10 µs, 1000 A (at 800 V) pulses. Single-shot switching was performed up to 5000 A/µs, and repetitive switching, at 500 Hz and 2000 A/µs for ten hours. No damage to the devices resulted from the switching stresses.
  • Keywords
    Anodes; Current measurement; Logic gates; Stress; Switches; Thyristors; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics Specialists Conference, 1985 IEEE
  • Conference_Location
    Toulouse, France
  • ISSN
    0275-9306
  • Type

    conf

  • DOI
    10.1109/PESC.1985.7070981
  • Filename
    7070981
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2210263