• DocumentCode
    2210293
  • Title

    On measurement of reverberation chamber time constant and related curve fitting techniques

  • Author

    Zhang, Xiaotian ; Robinson, Martin ; Flintoft, Ian

  • Author_Institution
    Applied Electromagnetics Lab, Department of Electronics, UK
  • fYear
    2015
  • fDate
    16-22 Aug. 2015
  • Firstpage
    406
  • Lastpage
    411
  • Abstract
    The reverberation chamber time constant quantifies how fast a reverberation chamber loses its stored energy at different frequencies, which makes it a very important parameter in many power related tests, such as the measurement of antenna efficiency, the measurement of absorption cross section, and the electromagnetic immunity test of electronic devices. The chamber time constant is usually obtained by doing regressions of power delay profile and calculating its gradient. But the shape of power delay profile can sometimes be distorted by the band limited window function applied in the frequency domain. A non-linear curve fitting technique which can cancel the effect of window function was developed, aiming to give a robust determination of the chamber time constant. With the help of this technique, window functions with much smaller bandwidth can be applied without introducing error in the evaluation of chamber time constant. In this paper, a 1 MHz wide window function in which only 10 samples of S21 are available was put under test and it was found a robust answer of chamber time constant can still be given by non-linear curve fitting techniques. Therefore the measurement time can be reduced and the frequency resolution of the chamber time constant can be increased at the same time.
  • Keywords
    Antenna measurements; Bandwidth; Mathematical model; Reverberation chambers; Time measurement; Time-frequency analysis; chamber time constant; non-linear curve fitting; power delay profile; reverberation chamber;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (EMC), 2015 IEEE International Symposium on
  • Conference_Location
    Dresden, Germany
  • Print_ISBN
    978-1-4799-6615-8
  • Type

    conf

  • DOI
    10.1109/ISEMC.2015.7256196
  • Filename
    7256196