• DocumentCode
    2210410
  • Title

    A comparison of voltage and sensitivity profiles from two forward problem solvers for three dimensional electrical impedance tomography

  • Author

    Kleinermann, F. ; Avis, N J

  • Author_Institution
    Dept. of Comput. Sci., Hull Univ., UK
  • Volume
    2
  • fYear
    1996
  • fDate
    31 Oct-3 Nov 1996
  • Firstpage
    798
  • Abstract
    Most published work on image reconstruction for Electrical Impedance Tomography (EIT) has concentrated on solving the two dimensional problem. Recently there has been increased interest in addressing the full three dimensional aspects of EIT. One image reconstruction approach for three dimensional EIT is to generate an inverted sensitivity matrix for the imaged volume which, when post multiplied by measured boundary voltage gradients, produces an imaged volume. In order to calculate the sensitivity matrix it is first necessary to solve the appropriate forward problem. This paper compares two methods for generating the solution to the forward problem for a right circular cylinder with eight drive electrodes evenly spaced in a plane around the cylinder, interleaved with eight voltage measurement electrodes. It assesses the implications of these two differing methods on the resulting image reconstruction
  • Keywords
    Laplace equations; computational complexity; electric impedance imaging; image reconstruction; medical image processing; problem solving; sensitivity analysis; 3D electrical impedance tomography; Laplace equation; boundary voltage gradients; forward problem solvers; image reconstruction; inverted sensitivity matrix; right circular cylinder; sensitivity profiles; tetrahedral elements; voltage profiles; Computer science; Conductivity; Distributed control; Drives; Electrodes; Engine cylinders; Image reconstruction; Impedance; Tomography; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 1996. Bridging Disciplines for Biomedicine. Proceedings of the 18th Annual International Conference of the IEEE
  • Conference_Location
    Amsterdam
  • Print_ISBN
    0-7803-3811-1
  • Type

    conf

  • DOI
    10.1109/IEMBS.1996.651982
  • Filename
    651982