DocumentCode :
2210410
Title :
A comparison of voltage and sensitivity profiles from two forward problem solvers for three dimensional electrical impedance tomography
Author :
Kleinermann, F. ; Avis, N J
Author_Institution :
Dept. of Comput. Sci., Hull Univ., UK
Volume :
2
fYear :
1996
fDate :
31 Oct-3 Nov 1996
Firstpage :
798
Abstract :
Most published work on image reconstruction for Electrical Impedance Tomography (EIT) has concentrated on solving the two dimensional problem. Recently there has been increased interest in addressing the full three dimensional aspects of EIT. One image reconstruction approach for three dimensional EIT is to generate an inverted sensitivity matrix for the imaged volume which, when post multiplied by measured boundary voltage gradients, produces an imaged volume. In order to calculate the sensitivity matrix it is first necessary to solve the appropriate forward problem. This paper compares two methods for generating the solution to the forward problem for a right circular cylinder with eight drive electrodes evenly spaced in a plane around the cylinder, interleaved with eight voltage measurement electrodes. It assesses the implications of these two differing methods on the resulting image reconstruction
Keywords :
Laplace equations; computational complexity; electric impedance imaging; image reconstruction; medical image processing; problem solving; sensitivity analysis; 3D electrical impedance tomography; Laplace equation; boundary voltage gradients; forward problem solvers; image reconstruction; inverted sensitivity matrix; right circular cylinder; sensitivity profiles; tetrahedral elements; voltage profiles; Computer science; Conductivity; Distributed control; Drives; Electrodes; Engine cylinders; Image reconstruction; Impedance; Tomography; Voltage measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society, 1996. Bridging Disciplines for Biomedicine. Proceedings of the 18th Annual International Conference of the IEEE
Conference_Location :
Amsterdam
Print_ISBN :
0-7803-3811-1
Type :
conf
DOI :
10.1109/IEMBS.1996.651982
Filename :
651982
Link To Document :
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