DocumentCode :
2210660
Title :
Experimental Investigation of the Validity of TDDB Voltage Acceleration Models
Author :
Suehle, John S. ; Chaparala, Prasad ; Messick, Cleston ; Miller, William M. ; Boyko, Kenneth C.
Author_Institution :
University of Maryland
fYear :
1993
fDate :
24-27 Oct 1993
Firstpage :
59
Lastpage :
67
Keywords :
Acceleration; Breakdown voltage; Capacitors; Dielectric breakdown; Life estimation; NIST; Predictive models; Probes; Stress; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Integrated Reliability Workshop Final Report, 1993 International
Type :
conf
DOI :
10.1109/IRWS.1993.666293
Filename :
666293
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2210660
