DocumentCode :
2210725
Title :
FDTD transient analysis of grounding grids a comparison of two different thin wire models
Author :
Diaz, L. ; Miry, C. ; Reineix, A. ; Guiffaut, C. ; Tatematsu, A.
Author_Institution :
Laboratoire de Matériaux Electriques, Electricité de France -EDF, Moret-sur-Loing, France
fYear :
2015
fDate :
16-22 Aug. 2015
Firstpage :
501
Lastpage :
506
Abstract :
A thin wire model for FDTD simulations is proposed for the study of transient potential rises and currents in a grounding grid. The model is an extension of the formalism of Holland, and it is compared with the thin wire model of Baba, Nagaoka, and Ametani, using a case study previously validated with measurements. Special interest is drawn on the computation of the potential close to the surface of conductors. To do so, an approximated formula based on the previous work of Noda and Yokoyama is proposed. The results are compared in terms of transient potential rises and currents in a grounding grid. The comparisons are in good agreement.
Keywords :
Finite difference methods; Grounding; Time-domain analysis; Wires; FDTD; grounding grid; thin wire; transient potentials;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility (EMC), 2015 IEEE International Symposium on
Conference_Location :
Dresden, Germany
Print_ISBN :
978-1-4799-6615-8
Type :
conf
DOI :
10.1109/ISEMC.2015.7256213
Filename :
7256213
Link To Document :
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