• DocumentCode
    2210832
  • Title

    Blind chip rate estimation in multirate CDMA transmissions using multirate sampling at slow flat fading channels

  • Author

    Ghavami, Siavash ; Abolhassani, Bahman

  • Author_Institution
    Dept. of Electr. Eng., Iran Univ. of Sci. & Technol., Tehran, Iran
  • fYear
    2008
  • fDate
    19-21 Nov. 2008
  • Firstpage
    1344
  • Lastpage
    1348
  • Abstract
    This paper considers blind chip rate estimation of direct sequence spread spectrum (DS-SS) signals in multirate and multiuser direct-sequence code division multiple accesses (DS-CDMA) in channels having slow flat Rayleigh fading plus additive white Gaussian noise. Channel impulse response is estimated by a subspace method, and then the chip rate of each signal is obtained using number of zero crossing of differential of estimated channel impulse response. For chip rate estimation of each user, weighted zero-crossing ratio is proposed. Maximum value of the weighted zero crossing ratio takes place in the sampling frequency, which is equal to the Nyquist rate, and it is same chip rate. Furthermore bit time of each user is estimated using fluctuations of autocorrelation estimators. Since code Length of each user can be obtained using bit time and chip time.
  • Keywords
    AWGN; Rayleigh channels; code division multiple access; fading channels; spread spectrum communication; CDMA transmissions; Nyquist rate; additive white Gaussian noise; autocorrelation estimators; blind chip rate estimation; direct sequence spread spectrum signals; direct-sequence code division multiple accesses Rayleigh fading; multirate sampling; slow flat fading channels; AWGN; Additive white noise; Fading; Fluctuations; Frequency estimation; Multiaccess communication; Noise level; Sampling methods; Signal to noise ratio; Spread spectrum communication; Blind estimation; Chip Time; Multirate CDMA; Multirate Sampling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Communication Systems, 2008. ICCS 2008. 11th IEEE Singapore International Conference on
  • Conference_Location
    Guangzhou
  • Print_ISBN
    978-1-4244-2423-8
  • Electronic_ISBN
    978-1-4244-2424-5
  • Type

    conf

  • DOI
    10.1109/ICCS.2008.4737402
  • Filename
    4737402