DocumentCode
2210842
Title
Dynamic modeling of degradation data
Author
Jiang, Mingxiao ; Zhang, Yongcang
Author_Institution
GE Corporate R&D, Niskayuna, NY, USA
fYear
2002
fDate
2002
Firstpage
607
Lastpage
611
Abstract
In applications with few or no failures, degradation data can provide more reliability information than traditional censored failure-time data. In this paper, the authors present a dynamic model of degradation data comparing to the general ones available in literature. Random fatigue crack growth is illustrated in detail as an example of degradation data problem. The proposed model is ready to be generalized to accelerated life testing (ALT) analysis under various testing conditions
Keywords
failure analysis; fatigue cracks; reliability; accelerated life testing; degradation data; degradation data dynamic modeling; failure analysis; random fatigue crack growth; reliability information; testing conditions; Data analysis; Failure analysis; Fatigue; Life estimation; Life testing; Markov processes; Research and development; Stochastic processes; Thermal degradation; Thermal stresses;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium, 2002. Proceedings. Annual
Conference_Location
Seattle, WA
ISSN
0149-144X
Print_ISBN
0-7803-7348-0
Type
conf
DOI
10.1109/RAMS.2002.981709
Filename
981709
Link To Document