Title :
Next-generation silicon analysis tools for RF integrated-circuits
Author :
Mehrotra, Amit ; Narayan, Amit ; Subramanian, Ravi
Author_Institution :
Berkeley Design Autom., Inc., Santa Clara, CA
Abstract :
This paper introduces new circuit analysis technology targeted to address the growing gap between what current circuit verification technology can deliver for today´s analog and RF integrated circuit designs, compared to what is observed and measured in silicon. We present key powerful new techniques for the precise and fast analysis and verification of RF integrated circuits. We also provide an overview of the key innovations in applied mathematics, numerical techniques, and software architecture that allow high speed and precision to be delivered together in circuit analysis. These techniques, taken together, comprise precision circuit analysis technology- targeted to address the growing verification problems found in the majority of today´s commercial analog/RF-rich integrated circuits. We demonstrate the application of this technology on commercially shipping designs in wireless, networking, and SoC applications
Keywords :
formal verification; network analysis; radiofrequency integrated circuits; silicon; RF integrated-circuits; Si; circuit analysis technology; circuit verification technology; silicon analysis tools; Circuit analysis; Current measurement; Integrated circuit measurements; Integrated circuit synthesis; Integrated circuit technology; Mathematics; Radio frequency; Radiofrequency integrated circuits; Silicon; Technological innovation;
Conference_Titel :
Radio Frequency Integrated Circuits (RFIC) Symposium, 2006 IEEE
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-9572-7
DOI :
10.1109/RFIC.2006.1651167