• DocumentCode
    2210994
  • Title

    Detection of Photosystem I Reaction Centers using Chemically Derivatized High Electron Mobility Transistor

  • Author

    Eliza, S.A. ; Islam, S.K. ; Lee, I. ; Greenbaum, E. ; Ericson, M.N. ; Khan, M.A.

  • Author_Institution
    Tennessee Univ., Knoxville
  • fYear
    2007
  • fDate
    28-31 Oct. 2007
  • Firstpage
    1456
  • Lastpage
    1459
  • Abstract
    This paper presents for the first time a micro-sensor for detecting Photosystem I (PS I) reaction centers. In oxygenic plants, photons are captured with high quantum efficiency by two specialized reaction centers, Photosystems I and II (PS I and PS II). Photon capture triggers rapid charge separation and the conversion of light energy into an electric voltage across the nanometer-scale (~6 nm) reaction centers. AlGaN/GaN based high electron mobility transistors (HEMTs) show high current throughputs and greater sensitivity to surface charges. PS I molecules were chemically immobilized on the HEMT device and significant changes in the transistor characteristics were noticed. With zero gate bias and 5 V at drain terminal, drain current changes by about 5 mA for 6muL drop of PS I solution. The difference between light and dark measurements is ~0.8 mA. Test results demonstrate that this approach is a potential candidate for detection and characterization of biomolecular photodiodes -PS I reaction centers.
  • Keywords
    biomolecular electronics; high electron mobility transistors; microsensors; AlGaN-GaN; HEMT device; PS I molecules; biomolecular photodiodes; chemically derivatized high electron mobility transistor; electric voltage; light energy conversion; microsensor; oxygenic plants; photon capture; photosystem I reaction centers; photosystem II; rapid charge separation; surface charges; voltage 5 V; Aluminum gallium nitride; Chemicals; Energy capture; Gallium nitride; HEMTs; MODFETs; Photodiodes; Testing; Throughput; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Sensors, 2007 IEEE
  • Conference_Location
    Atlanta, GA
  • ISSN
    1930-0395
  • Print_ISBN
    978-1-4244-1261-7
  • Electronic_ISBN
    1930-0395
  • Type

    conf

  • DOI
    10.1109/ICSENS.2007.4388688
  • Filename
    4388688