• DocumentCode
    2211037
  • Title

    Logical data model to support an environmental management system within an electronics industry manufacturing facility

  • Author

    Dougherty, Michael

  • Author_Institution
    Enviromatix Inc., USA
  • fYear
    1994
  • fDate
    2-4 May 1994
  • Firstpage
    58
  • Lastpage
    61
  • Abstract
    The International Standards Organisation (ISO) and the International Electrotechnical Committee (IEC) established the Strategic Advisory Group for the Environment (SAGE) in 1991 to develop recommendations in the area of international standards for the environment. A subsequent work group, S01, was established to develop standards for environmental management systems in 1992. The efforts of SOL have been translated into a model which provides the basis for standardization. Environmental regulations reach deep into the operations of an electronic manufacturing facility. These regulations cover the full spectrum of environmental concerns including: air emissions, water emissions, chemical inventories, process safety, accidental release, and worker exposure. Historically, industry has attempted to deploy separate and discrete software packages to satisfy environmental regulatory compliance. This approach has met with only moderate success due to the relative lack of integration with the manufacturing and business processes. The goal of this paper is to identify and develop a logical data model to support an environmental management system for an electronic manufacturer developed around the ISO guidelines. This environmental management data model can then provide the foundation for deploying information technology integrated in the manufacturing environment
  • Keywords
    Air safety; Chemical processes; Data models; Environmental management; IEC standards; ISO standards; Production facilities; Standardization; Standards development; Virtual manufacturing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics and the Environment, 1994. ISEE 1994., Proceedings., 1994 IEEE International Symposium on
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    0-7803-1769-6
  • Type

    conf

  • DOI
    10.1109/ISEE.1994.337285
  • Filename
    337285