Title :
A study of intensify the power of verification for memory worst case conditions through the SI analysis
Author :
Lee, Chang-Ik ; Kim, Mi-Ro
Author_Institution :
CAE Team in the Hyundai Mobis, Yongin-Si, Korea
Abstract :
Electrical units of vehicle are installed in the harsh environment and we need to effectively verify in the step of pre-verify in order to minimize field defects. In this paper, we considered various worst case of memory communication conditions to intensify the power of verification and verified the effectiveness.
Keywords :
Jitter; Standards; DC-DC Converter; DDR; Jitter; Ripple; Surge;
Conference_Titel :
Electromagnetic Compatibility (EMC), 2015 IEEE International Symposium on
Conference_Location :
Dresden, Germany
Print_ISBN :
978-1-4799-6615-8
DOI :
10.1109/ISEMC.2015.7256238
