DocumentCode :
2211280
Title :
Advanced antenna diagnostics and pattern processing form measured data
Author :
Quijano, J. L Araque ; Vecchi, G. ; Foged, L.J. ; Chauvet, F.
Author_Institution :
Politec. di Torino, Torino, Italy
fYear :
2010
fDate :
11-13 Aug. 2010
Firstpage :
61
Lastpage :
65
Abstract :
We want to reconstruct equivalent sources on a “reconstruction surface” ΣR that encloses a volume Ω where the equipment under test (EUT) lies; the EUT encompasses the antenna(s) and possible neighboring scatterers, as need in the application of interest. We employ the equivalence theorem to represent the fields outside the reconstruction surface ΣR and on it. Note that it is typically desirable or necessary to place this surface not on metals (even when the antenna is metallic), and the employed technique must account for this more general case. These equivalent sources are next computed under the stipulation that they radiate the same fields as measured on a given measurement surface ΣM. The formulation is based on a new approach presented in, which employs two integral equations instead of the usual single equation. It has been shown that unlike the standard approach in the literature (e.g.) this approach yields Love´s currents on the surface (that is, fields) and has an added stability that, under proper application, does not require external (low-pass) regularization.
Keywords :
antenna radiation patterns; dipole antennas; electromagnetic wave scattering; integral equations; low-pass filters; Love´s currents; advanced antenna diagnostics; equipment under test; equivalent source reconstruction surface; external low-pass regularization; integral equations; neighboring scatterers; pattern processing; Antenna measurements; Current measurement; Dipole antennas; Magnetic field measurement; Surface reconstruction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applications of Electromagnetism and Student Innovation Competition Awards (AEM2C), 2010 International Conference on
Conference_Location :
Taipei
Print_ISBN :
978-1-4244-6416-6
Type :
conf
DOI :
10.1109/AEM2C.2010.5578790
Filename :
5578790
Link To Document :
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